Research | Measurement of photo-thermal properties of materials | Custom measurement

Custom measurement

SNEHT

Spectral normal emissivity at high temperatures

EDEHT

Effective directional emissivity at high temperatures

SNHRRT

Spectral normal hemispherical reflectance at room temperature

SNHTRT

Spectral normal hemispherical transmittance at room temperature

SDRRT

Spectral directional reflectance at room temperature

SNTRT

Spectral normal transmittance at room temperature

Measurement methods overview

Method	Method quantity	Computed quantities	Temperatures	Spectral range
SNEHT	emissivity	x	250 – 1000°C	1.38 – 26 um
EDEHT	emissivity	x	100 – 1000°C	7.5 – 14 um
SNHRRT	reflectance	absorptivity, emissivity	25°C	0.32 – 1.2 um a 1.5 – 20 um
SNHTRT	transmittance	absorptivity, emissivity (in combination with SNHRRT method)	25°C	0.32 – 1.2 um a 1.5 – 20 um
SDRRT	reflectance	x	25°C	1.5 – 20 um
SNTRT	transmittance	x	25°C	0.38 – 28.5 um

Our approach

Uniqueness

The methods used are the result of our research and development. The uniqueness of the methods is presented in publications in international journals.

Functionality

We perform extensive tests of our developed methods. The measurement results are verified using interlaboratory comparison tests.

Speed

Our sample measurement procedures are standardized so we can offer a quick response to your request, depending on the current capacity of the laboratory.

Cooperation

We offer standardized measurement of your samples or development of a measuring system tailored for your application.